Partner: sglux GmbH
period: 2011-2013
acknowledgements: BMWi ZIM EP 102409
Abstract
A 128 pixel SiC UV spectrometer with a wavelength resolution of 2.3nm/pixel was development. The advantage of such kind of UV spectrometers result from the extreme radiation hardness and very high visible blindness of SiC compared with Si based UV spectrometers leading to zero stray light effects caused by visible light. This new spectrometer technology allows precise UV spectrometry in the presence of strong visible light such as UV measurements in the bright sun or under room light. Another advantage of the SiC based UV spectrometer results from the high radiation hardness and low dark current of this material. This features lead to a broader dynamic range of the spectrometer compared with conventional Si based spectrometers.