Partner: Leibniz Ferdinand Braun Institut f\u00fcr H\u00f6chstfrequenztechnik (FBH), Leibniz Institut f\u00fcr Kristallz\u00fcchtung (IKZ), sglux GmbH
\nperiod: 2016 – 2019
\nacknowledgements: BMBF 03ZZ0119A<\/p>\n
Abstract<\/em> Partner: Leibniz Ferdinand Braun Institut f\u00fcr H\u00f6chstfrequenztechnik (FBH), Leibniz Institut f\u00fcr Kristallz\u00fcchtung (IKZ), sglux GmbH Abstract<\/em>
\nThis project aims at the development of optics, electronics and software for miniaturized SiC UV spectrometers and camera modules. sglux as the first company worldwide is working on a new product family of Silicon Carbide (SiC) based UV spectrometers (up to 1024 pixel resolution). The advantage of such UV spectrometers results from the extreme radiation hardness and very high visible blindness of SiC compared with Silicon (Si) based UV spectrometers leading to negligible degradation and zero stray light effects caused by visible light. This new spectrometer technology allows precise UV spectrometry also at presence of strong visible light such as UV measurements in the bright sun (e.g. UV Index spectroscopy) or under room light. Another advantage of the SiC UV spectrometer results from the high radiation hardness and low dark current of this material. These features lead to a broader dynamic range of the spectrometer compared with conventional Si based spectrometers. Spectrometers with a 128 pixel resolution are available for evaluation purpose.<\/p>\n","protected":false},"excerpt":{"rendered":"
\nperiod: 2016 – 2019
\nacknowledgements: BMBF 03ZZ0119A<\/p>\n
\nThis project aims at the development of optics, electronics and software for miniaturized SiC UV spectrometers and camera modules. sglux as the first company worldwide is working on a new product family of Silicon Carbide (SiC) based UV spectrometers (up to 1024 pixel resolution). The advantage of such UV spectrometers results from the extreme radiation hardness and very high visible blindness of SiC compared with Silicon (Si) based UV spectrometers leading to negligible degradation and zero stray light effects caused by visible light. This new spectrometer technology allows precise UV spectrometry also at presence of strong visible light such as UV measurements in the bright sun (e.g. UV Index spectroscopy) or under room light. Another advantage of the SiC UV spectrometer results from the high radiation hardness and low dark current of this material. These features lead to a broader dynamic range of the spectrometer compared with conventional Si based spectrometers. Spectrometers with a 128 pixel resolution are available for evaluation purpose.<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_genesis_hide_title":false,"_genesis_hide_breadcrumbs":false,"_genesis_hide_singular_image":false,"_genesis_hide_footer_widgets":false,"_genesis_custom_body_class":"","_genesis_custom_post_class":"","_genesis_layout":"","footnotes":""},"categories":[523,188],"tags":[],"class_list":{"0":"post-10837","1":"post","2":"type-post","3":"status-publish","4":"format-standard","6":"category-abgeschlossene-arbeiten","7":"category-recherche-fr","8":"entry"},"acf":[],"yoast_head":"\n